Local Atomic Structure Analysis on the Active Center of Functional Materials
Scope
This symposium aims to introduce and discuss about the recent cutting edge local atomic structure analysis on the active center of functional materials. Local atomic structure around active center atom plays crucial role in functional materials such as dopant in semiconductor, high temperature ferromagnetic semiconductors or superconductors. The atomic structure around this kind of local specific atom, however, has not been able to be analyzed by a standard structure analysis method of x-ray diffraction (XRD) because this kind of active site has no translational symmetry. Recently this area has grown rapidly by the development of new local structure analysis methods, such as photoelectron holography, X-ray fluorescence holography, neutron holography, CTR holography, electron or X-ray diffractive imaging, stereo atomscope, etc. The atomic structure around dopants in inorganic materials, catalysts, organic devices, active center of protein have been revealed recently.
Topics
- Active center
- Functional Materials
- Atomic-resolution holography
- Atomic Stereography
- Diffractive Imaging
- Synchrotron Radiation
- Neutron
Symposium Keynote
Kenji OHOYAMA
Ibaraki University
Invited Speakers
- Gareth S. PARKINSON, TU Wien Hydrogen impurity in semiconductors: approach by first-principles calculations (tentative)
- Carsten WESTPHAL, Technische Universitat Dortmund
- Tsuyshi MIYAZAKI, National Institute of Materials Science
Organizers
- Hiroshi DAIMON Nara Institute of Science and Technology
- Kouichi HAYASHI Nagoya Institute of Technology
- Phil Woodruf University of Warwick
- Ian McNulty MAX IV
Correspondence
- Kouichi HAYASHI, Nagoya Institute of Technology Email: hayashi.koichi@nitech.ac.jp